Field-emission microscopy (FEM) is an analytical technique used in materials science to investigate molecular surface structures and their electronic properties. Invented by Erwin Wilhelm Müller in ...

The Hitachi S4000 Field Emission Scanning Electron Microscope (FESEM) with IXRF Energy-dispersive X-ray Spectrometer (EDS) is a cold field emission SEM that is fast and easy to use. Good for ...

Microscope can magnify objects greater than 1,000,000 times and will chiefly aid in research and development of nanomaterials, thin films SAN ANTONIO--(BUSINESS WIRE)--Southwest Research Institute is ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

In recent decades, the Field Emission Scanning Electron Microscope (FE-SEM) has become a cornerstone of analytical science, offering professionals across various scientific and engineering disciplines ...

Combines a high-resolution field emission scanning electron microscope with gallium focused ion column capable of ion milling material at the nanoscale.

Tsukuba, Japan—Research and development of organic electronics such as organic solar cells and organic light-emitting diodes is rapidly advancing. The "shape" of the electron orbitals of organic ...

(Nanowerk News) The National Institute for Materials Science (NIMS) and JEOL, Ltd. have developed a lanthanum hexaboride (LaB6) nanowire-based field emission gun that is installable on an ...

The Hitachi SU70 Field Emission Scanning Electron Microscope (FESEM) with Oxford Energy-dispersive X-ray Spectrometer (EDS) is a top level research grade SEM with excellent performance both at low kV ...

Engineers have developed a lanthanum hexaboride (LaB6) nanowire-based field emission gun that is installable on an aberration-corrected transmission electron microscope (TEM). This combined unit is ...