Veeco Instruments has announced that it has shipped its Spector Ion Beam Sputtering (IBS) system and Sirius Optical Monitor System to the Fraunhofer Institute for Telecommunications (HHI). The ...
It has been over 30 years since the first focused ion beam was used to make a TEM specimen. FEI, a company that is now part of Thermo Fisher Scientific, has been an essential part of helping take ion ...
Precisely quantifying metal oxide samples’ chemical compositions with X-ray photoelectron spectroscopy (XPS) may be adversely impacted by adventitious carbon contamination, which is often found on the ...
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